Zvi Hersh Goldshtein

Title: Zvi Hersh Goldshtein and Semiconductor Defect Classification.

Introduction

Zvi Hersh Goldshtein is an inventor based in Sunnyvale, California, United States. His work includes a patent on using optical inspection and machine learning to classify defects in semiconductor manufacturing.

Latest Patents

Goldshtein is associated with 1 patent: “Optical Inspection-Based Automatic Defect Classification.” The disclosed techniques collect optical inspection data from training samples containing multiple defects and use that data to create a training set with defect descriptions, images, and ground-truth classifications. Multiple machine-learning classifiers are trained to predict defect classifications. The classifiers that meet specified accuracy criteria are selected and used to classify defects in semiconductor manufacturing samples.

Career Highlights

Goldshtein is associated with Applied Materials, Inc., a company whose work includes technologies for semiconductor manufacturing. His patent describes an approach intended to make inspection and defect classification more efficient.

Collaborations

Goldshtein’s listed coworkers include Navneet Kumar Singh and Arun Ramaswamy Srivatsa. The patent’s disclosed methods bring together optical inspection data, labeled training examples, and machine-learning classifiers.

Conclusion

Zvi Hersh Goldshtein’s patent focuses on applying machine learning to optical inspection, supporting more efficient defect classification in semiconductor manufacturing.