Shanghai, China

Zuowei Xie

This inventor holds 1 USPTO granted patent. Top assignee: Baolong Huf Shanghai Electronic Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zuowei Xie. Retrieved from https://idiyas.com/inventor/zuowei-xie-tqt2fm6s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zuowei Xie: Innovator in Sensor Technology

Introduction

Zuowei Xie is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of sensor technology, particularly in the development of innovative solutions for electronic devices. His work is characterized by a commitment to enhancing functionality and user experience.

Latest Patents

Zuowei Xie holds a patent for a "Sensor Set for a Door Switch." This invention showcases his ability to create practical and efficient solutions that address everyday challenges. The patent reflects his expertise in sensor technology and its applications in modern electronic systems. He has 1 patent to his name.

Career Highlights

Zuowei Xie is currently employed at Baolong Huf Shanghai Electronic Co., Ltd. This company is known for its advancements in electronic components and systems. His role at Baolong Huf allows him to apply his innovative ideas in a collaborative environment, contributing to the company's success in the industry.

Collaborations

Zuowei Xie has worked alongside talented colleagues, including Zuofei Tong and Yang He. Their collaboration fosters a creative atmosphere that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Zuowei Xie's contributions to sensor technology exemplify his dedication to innovation and excellence. His work continues to influence the electronic industry, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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