Pécs, Hungary

Zoltán Bognár

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Pecsi Tudomanyegyetem, Semmelweis University. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zoltán Bognár. Retrieved from https://idiyas.com/inventor/zoltán-bognár

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Zoltán Bognár: Innovator in Embryo Assessment Technology

Introduction

Zoltán Bognár is a notable inventor based in Pécs, Hungary. He has made significant contributions to the field of reproductive technology, particularly through his innovative patent related to embryo assessment.

Latest Patents

Bognár holds a patent for a non-invasive method to assess embryo competence. This invention provides a simple, inexpensive, and quick approach to evaluate embryo competence in vitro. The method involves detecting nucleic acid-containing extracellular vesicles in the culture medium of the embryo. The culture medium can be fixed before being stained with propidium iodide and analyzed by flow cytometry.

Career Highlights

Throughout his career, Zoltán Bognár has worked with prestigious institutions, including Pécsi Tudományegyetem and Semmelweis Egyetem. His work has focused on advancing techniques in reproductive health and embryo evaluation.

Collaborations

Bognár has collaborated with notable colleagues such as Éva Pállinger and Júlia Szekeres. Their joint efforts have contributed to the development of innovative solutions in the field of embryology.

Conclusion

Zoltán Bognár's contributions to embryo assessment technology highlight his role as an important figure in reproductive science. His innovative methods continue to influence the field and improve outcomes in embryo evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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