Sebastopol, CA, United States of America

Zoltana D Azary

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zoltana D Azary. Retrieved from https://idiyas.com/inventor/zoltana-d-azary

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Zoltana D Azary: Innovator in Optical Spectrum Analysis

Introduction

Zoltana D Azary is a notable inventor based in Sebastopol, California. He has made significant contributions to the field of optical spectrum analysis, showcasing his innovative spirit through his patented inventions.

Latest Patents

Zoltana holds a patent for an "Optical spectrum analyzer having adjustable sensitivity." This invention allows users to select sensitivity levels for measuring input light beams. The device adjusts operating parameters based on user selection, enabling precise measurements. Key features include setting the gain of a video channel, adjusting video bandwidth, and incorporating a digital filter for enhanced sensitivity. A peak detector is also integrated to ensure accurate signal amplitude measurements during fast scanning conditions.

Career Highlights

Zoltana D Azary has worked with Hewlett-Packard Company, where he has applied his expertise in optical technologies. His work has contributed to advancements in measurement techniques and optical analysis.

Collaborations

Throughout his career, Zoltana has collaborated with esteemed colleagues such as James R Stimple and Kenneth R Wildnauer. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Zoltana D Azary's contributions to optical spectrum analysis exemplify his dedication to innovation and technology. His patented invention continues to impact the industry, showcasing the importance of adjustable sensitivity in optical measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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