Zoltan Mirk

Title: Zoltan Mirk and Semiconductor Measurement Innovation.

Introduction

Zoltan Mirk is an inventor associated with Budapest, Hungary, and Semilab Felvezeto Fizikai Lab, Rt. His work includes a patent for a contactless method and apparatus for measuring minority carrier lifetime in semiconductor specimens.

Latest Patents

Mirk’s listed patent, “Method and Apparatus for Measuring Minority Carrier Lifetime,” describes a system that uses a tunable microwave generator and a narrowband microstrip antenna positioned near a semiconductor specimen. A pulsed laser sends optical energy through a hole in the antenna, generating minority carriers in the specimen. As those carriers recombine after each pulse, their decay affects the microwave energy reflected from the specimen. A detector measures this response, and a computer can control the system and process the resulting signals. The near-field arrangement provides a stronger microwave field, while the specimen’s role in the microwave path helps make measurements less sensitive to mechanical vibration. Mirk is credited with 1 patent.

Career Highlights

Mirk’s patent work addresses semiconductor characterization through contactless measurement. The described approach combines microwave sensing, pulsed optical excitation, and signal processing to assess minority carrier lifetime.

Collaborations

Mirk’s listed coworkers include Peter Horvath and Tibor Pavelka. His company affiliation is Semilab Felvezeto Fizikai Lab, Rt.

Conclusion

Zoltan Mirk’s patent presents a contactless technique for measuring minority carrier lifetime, combining microwave detection and pulsed laser excitation for semiconductor analysis.