Pittsburgh, PA, United States of America

Ziyan Wang

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ziyan Wang. Retrieved from https://idiyas.com/inventor/ziyan-wang-p3smk1oz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Ziyan Wang and Parametric Scene Representation

Introduction

Ziyan Wang is an inventor associated with Pittsburgh, Pennsylvania, and NEC Corporation. His patent work addresses scene representation for autonomous tasks, combining visual mapping, semantic layouts, and three-dimensional localization.

Latest Patents

Wang is credited with 1 patent: “Parametric Top-View Representation of Scenes.” The invention describes a method that generates an initial scene map from one or more perspective images, then uses a parametric model to derive a representation of scene elements and their estimated semantic layout. It also identifies predicted locations for those elements through three-dimensional localization and places them onto the representation to create an overlay for an autonomous task.

Career Highlights

Wang’s listed patent reflects work on representing visual scenes in a structured form that can support autonomous task performance. The approach connects image-based mapping with semantic scene descriptions and predicted object locations.

Collaborations

Wang’s listed coworkers include Buyu Liu and Manmohan Chandraker. His patent is associated with NEC Corporation.

Conclusion

Ziyan Wang’s patent focuses on using parametric scene representations and three-dimensional localization to help prepare visual information for autonomous tasks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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