This inventor holds 2 USPTO granted patents. Top assignees: The State of Israel, Atomic Energy Commission, Other. Active years: 1985-1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1985-1986
Title: Ziv Karny: Innovator in Optical Measurement Technologies
Introduction
Ziv Karny is a notable inventor based in Omer, IL, recognized for his contributions to optical measurement technologies. With a total of 2 patents, Karny has developed innovative methods that enhance the understanding and measurement of light properties in various fluids.
Latest Patents
Karny's latest patents include a "Method and apparatus for measuring the index of refraction of fluids." This invention involves a system that determines the index of refraction of a sample fluid by directing light from a collimated source through a cell containing both sample and reference fluids. The light transmitted through the cell is deflected and directed through a pair of gratings to establish patterns. By measuring the changes between the patterns created with the reference fluid and those with the sample fluid, the index of refraction can be accurately determined. Another significant patent is the "Frequency marking systems," which provides a frequency marker system for indicating the wavelength of light rays. This system includes means for collimating light rays and determining changes in wavelengths responsive to frequency changes by analyzing deflections of Moire patterns.
Career Highlights
Throughout his career, Ziv Karny has worked with esteemed organizations, including the State of Israel and the Atomic Energy Commission. His work in these institutions has contributed to advancements in optical technologies and measurement systems.
Collaborations
Karny has collaborated with notable colleagues such as Oded Kafri and Eliezer Keren, further enhancing his innovative projects and research endeavors.
Conclusion
Ziv Karny's work in optical measurement technologies showcases his dedication to innovation and scientific advancement. His patents reflect a deep understanding of light properties and their applications in various fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile