Beijing, China

Zirao Zhao

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Nuctech Company Limited, Tsinghua University. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zirao Zhao. Retrieved from https://idiyas.com/inventor/zirao-zhao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Zirao Zhao: Innovator in Article Detection Technology

Introduction

Zirao Zhao is a prominent inventor based in Beijing, China. He is known for his contributions to the field of article detection technology. His innovative approach has led to advancements in the accuracy and speed of detecting dangerous articles.

Latest Patents

Zhao holds a patent for an "Article detection apparatus and a detecting method." This invention discloses a method that utilizes a combination of a DR subsystem and a CT subsystem to enhance the detection of dangerous articles. By obtaining projection data at different angles, the method significantly improves the amount of data used for judgment, thereby increasing both detection accuracy and speed.

Career Highlights

Throughout his career, Zirao Zhao has worked with notable organizations, including Nuctech Company Limited and Tsinghua University. His experience in these institutions has contributed to his expertise in developing advanced detection technologies.

Collaborations

Zhao has collaborated with several professionals in his field, including Zhiqiang Chen and Yuanjing Li. Their collective efforts have furthered the development of innovative detection methods.

Conclusion

Zirao Zhao's work in article detection technology exemplifies the impact of innovation on safety and security. His patented methods and collaborations highlight his significant contributions to the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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