Company Filing History:
Years Active: 2021-2022
Title: Innovations of Zijing Huang in Steel Defect Testing
Introduction
Zijing Huang is a prominent inventor based in Beijing, China. He has made significant contributions to the field of defect detection in steel materials. With a total of 2 patents, his work focuses on innovative methods and devices that enhance the accuracy and efficiency of testing for defects in steel.
Latest Patents
Zijing Huang's latest patents include two groundbreaking inventions. The first is a "Device and method for testing steel defect based on internal and external magnetic perturbation." This invention features a magnetizer that generates two types of magnetic field regions for testing, a double-row magnetic sensor probe for data collection, a master controller for data pre-processing, scanner wheels for sampling triggers, and a host computer for data analysis. The second patent is titled "Device and method for detecting defect contour with omnidirectionally equal sensitivity based on magnetic excitation." This device utilizes a magnetic sensor array in a uniform magnetic field to collect signals and a data analysis module to extract and visualize defect contours.
Career Highlights
Zijing Huang is affiliated with Tsinghua University, where he continues to advance research in the field of materials testing. His innovative approaches have garnered attention in both academic and industrial circles. His work not only contributes to the scientific community but also has practical applications in various industries.
Collaborations
Zijing Huang collaborates with notable colleagues, including Songling Huang and Wenzhi Wang. Their combined expertise enhances the research and development efforts in defect detection technologies.
Conclusion
Zijing Huang's contributions to the field of steel defect testing through his innovative patents demonstrate his commitment to advancing technology. His work at Tsinghua University and collaborations with fellow researchers further solidify his impact in this critical area of study.