Beijing, China

Zi-Quan Bai

This inventor holds 1 USPTO granted patent. Top assignee: Keysight Technologies, Inc.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zi-Quan Bai. Retrieved from https://idiyas.com/inventor/zi-quan-bai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations by Zi-Quan Bai in LiDAR Technology

Introduction

Zi-Quan Bai is an accomplished inventor based in Beijing, China. He has made significant contributions to the field of LiDAR technology, particularly in the emulation of echo signals. His innovative work has implications for various applications, enhancing the functionality and accuracy of LiDAR sensors.

Latest Patents

Zi-Quan Bai holds a patent for a "System and method for emulating echo signals for a LiDAR sensor." This patent describes a comprehensive method for emulating echo signals in response to a LiDAR signal. The method involves updating the current position of a moving emulated target based on a 3D simulation scene, estimating the target's next position, performing ray tracing, and transmitting emulated echo signals to the LiDAR sensor.

Career Highlights

Zi-Quan Bai is currently employed at Keysight Technologies, Inc., where he continues to develop and refine his innovative ideas. His work focuses on enhancing the capabilities of LiDAR systems, which are crucial for various technological advancements.

Collaborations

Zi-Quan Bai collaborates with notable colleagues, including Li Qiu and Lee Alton Barford. These partnerships foster a creative environment that drives innovation and leads to groundbreaking advancements in their field.

Conclusion

Zi-Quan Bai's contributions to LiDAR technology through his patent and collaborative efforts highlight his role as a key innovator in the industry. His work continues to influence the development of advanced sensor technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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