Singapore, Singapore

Zi Heng Lim

This inventor holds 1 USPTO granted patent. Top assignee: National University of Singapore. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Zi Heng Lim in Infrared Spectrometry

Introduction

Zi Heng Lim is a notable inventor based in Singapore, recognized for his contributions to the field of infrared spectrometry. He has developed innovative technologies that enhance the capabilities of spectrometers, making significant strides in the analysis of infrared light.

Latest Patents

Zi Heng Lim holds a patent for a "Cascaded, self-calibrated, single-pixel infrared Hadamard transform spectrometer." This invention includes a method for performing infrared spectrometry, which involves several key steps. The method provides a first single pixel detector sensitive to infrared light in a specific spectral range. It also includes an entrance slit for receiving an infrared light signal and a moveable encoding mask for encoding based multiplexing. The mask comprises at least three adjacent coding sections, each with a cyclic coding pattern. The invention further incorporates dispersion and imaging optics to disperse the infrared signal and collect an encoding-based multiplexed version of the infrared signal onto the first single pixel photodetector.

Career Highlights

Zi Heng Lim is affiliated with the National University of Singapore, where he continues to advance research in infrared technologies. His work has garnered attention for its innovative approach to spectrometry, contributing to the academic and practical applications of infrared analysis.

Collaborations

Zi Heng Lim has collaborated with notable colleagues, including Yi Qi and Senthil Kumar Anantharajan, to further enhance the research and development of infrared technologies.

Conclusion

Zi Heng Lim's contributions to infrared spectrometry exemplify the innovative spirit of modern inventors. His patent reflects a significant advancement in the field, showcasing the potential for further developments in spectrometric analysis.

Profile summary based on public USPTO records.
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