Shenzhen, China

Zhuoyao Huang

This inventor holds 1 USPTO granted patent. Top assignee: Zte Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhuoyao Huang. Retrieved from https://idiyas.com/inventor/zhuoyao-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Zhuoyao Huang and Federated Learning for OTN Digital Twins.

Introduction

Zhuoyao Huang is an inventor based in Shenzhen, China, whose patent work addresses digital twin network generation for optical transport networks. His disclosed invention applies federated learning techniques to support cross-domain fault root cause identification.

Latest Patents

Huang is associated with 1 patent: “OTN Digital Twin Network Generation Method and System Based on Longitudinal Federated Learning.” The disclosure describes homomorphically encrypting a local fault root cause identifier, receiving encrypted alarm sample sequences associated with that identifier, and using the encrypted information to create a single-domain training set. A local cross-domain fault root cause identification model is trained on that set, and its parameter update is reported to a multi-domain orchestration system.

Career Highlights

Huang is associated with ZTE Corporation. His patent reflects work on combining privacy-preserving data processing and federated model training for network fault analysis.

Collaborations

The provided information lists Dajiang Wang and Qilei Wang as Huang’s coworkers. The patent description also identifies a multi-domain orchestration system as the recipient of model parameter updates.

Conclusion

Zhuoyao Huang’s disclosed patent focuses on using encrypted data and federated learning to generate OTN digital twin networks and support cross-domain fault identification.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…