Shenzhen, China

Zhongshan Wang

This inventor holds 2 USPTO granted patents. Top assignee: Qualcomm Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhongshan Wang. Retrieved from https://idiyas.com/inventor/zhongshan-wang-r6owsoy2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Zhongshan Wang: Video and Image Processing Innovations.

Introduction

Zhongshan Wang is an inventor based in Shenzhen, China, whose patent work focuses on video and image processing. His listed portfolio includes 2 patents, including inventions addressing scene-cut detection and noise reduction.

Latest Patents

“High Dynamic Range Scene Cut Detection” describes techniques for processing video frames, identifying scene cuts, and determining a smoothed histogram based on those cuts. The disclosed approach can compare characteristics of different frames and identify a scene cut when their difference exceeds a threshold.

“Cascade Image Processing for Noise Reduction” presents methods and devices for reducing noise in low-light video sequences. It uses cascaded image-processing operations, which may be implemented through image post-processing engines within an image signal processor.

Career Highlights

Wang is associated with Qualcomm Incorporated. His listed patent work reflects an emphasis on image signal processing and improving the handling of video in challenging conditions, including high dynamic range scenes and low-light environments.

Collaborations

Quanmin Shen is identified as a coworker. The provided information does not specify their particular roles or contributions to the listed inventions.

Conclusion

Zhongshan Wang’s two listed patents highlight practical approaches to video scene analysis and low-light image noise reduction, areas relevant to modern imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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