Sugar Land, TX, United States of America

Zhiyuan Wei

This inventor holds 1 USPTO granted patent. Top assignee: Cgg Services Sas. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhiyuan Wei. Retrieved from https://idiyas.com/inventor/zhiyuan-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Zhiyuan Wei in Seismic Imaging

Introduction

Zhiyuan Wei is an accomplished inventor based in Sugarland, TX (US). He has made significant contributions to the field of seismic imaging, particularly through his innovative methods that enhance the understanding of subsurface structures.

Latest Patents

Zhiyuan Wei holds a patent for a "System and method for elastic full waveform inversion and imaging." This method involves a comprehensive approach to seismic imaging of the subsurface using full waveform inversion (FWI). The process includes obtaining an initial P-velocity model, generating an S-velocity model, and creating an elastic synthetic dataset. It also involves updating the P-velocity model based on recorded seismic data and generating an image of the subsurface based on reflectivity.

Career Highlights

Wei is associated with Cgg Services Sas, where he applies his expertise in seismic imaging. His work has been pivotal in advancing techniques that improve the accuracy of subsurface imaging, which is crucial for various applications in geophysics and resource exploration.

Collaborations

Zhiyuan Wei has collaborated with notable colleagues, including Zedong Wu and Zhigang Zhang. Their combined efforts contribute to the innovative research and development in the field of seismic imaging.

Conclusion

Zhiyuan Wei's contributions to seismic imaging through his patented methods demonstrate his expertise and commitment to advancing technology in this critical field. His work continues to influence the way subsurface structures are understood and analyzed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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