Nanjing, China

Zhiyuan Ding

This inventor holds 1 USPTO granted patent. Top assignee: Nanjing University. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhiyuan Ding. Retrieved from https://idiyas.com/inventor/zhiyuan-ding

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Zhiyuan Ding: Innovator in Imaging Technology

Introduction

Zhiyuan Ding is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of imaging technology, particularly in sample image data acquisition. His innovative work has led to the development of advanced imaging devices and methods.

Latest Patents

Zhiyuan Ding holds a patent for an "Imaging device, imaging method, and imaging system." This invention discloses an imaging device that includes a charged particle source, a convergence system, a scanning control system, a detection module, and a spectral analysis module. The detection module features multiple pixelated detector units and is designed to obtain diffraction patterns while performing spectral analysis on a charged particle beam. This method, based on hollow ptychography, allows for effective imaging with excellent results.

Career Highlights

Zhiyuan Ding is affiliated with Nanjing University, where he continues to advance research in imaging technology. His work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

Zhiyuan has collaborated with notable colleagues, including Peng Wang and Si Gao, contributing to the advancement of imaging technologies through teamwork and shared expertise.

Conclusion

Zhiyuan Ding's contributions to imaging technology exemplify the impact of innovative thinking in scientific research. His patent and ongoing work at Nanjing University highlight his role as a key figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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