Jiangsu, China

Zhiwei Jiang

This inventor holds 1 USPTO granted patent. Top assignee: Makita Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhiwei Jiang. Retrieved from https://idiyas.com/inventor/zhiwei-jiang-t3vs053m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Zhiwei Jiang: Innovator in Dust Collection Technology

Introduction

Zhiwei Jiang is a notable inventor based in Jiangsu, China. He has made significant contributions to the field of portable electric tools, particularly with his innovative designs aimed at enhancing efficiency and functionality.

Latest Patents

Zhiwei Jiang holds a patent for a dust collector attachment specifically designed for portable electric hammer drills. This invention addresses the common issue of dust and debris generated during drilling, providing a cleaner and safer working environment.

Career Highlights

Zhiwei Jiang is currently employed at Makita Corporation, a leading manufacturer of power tools and outdoor equipment. His work at Makita has allowed him to focus on developing practical solutions that improve user experience and tool performance.

Collaborations

Throughout his career, Zhiwei has collaborated with talented individuals such as Yali Zhou and Mizuki Yamamoto. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Zhiwei Jiang's contributions to the field of portable electric tools, particularly through his patented dust collector attachment, highlight his commitment to innovation and improving user safety. His work at Makita Corporation and collaborations with other professionals further emphasize his role as a key figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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