Taiyuan, China

Zhiqi Xu

This inventor holds 1 USPTO granted patent. Top assignees: State Grid Shanxi Electric Power Research Institute, Taiyuan University of Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhiqi Xu. Retrieved from https://idiyas.com/inventor/zhiqi-xu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Zhiqi Xu - Innovator in Subsurface Defect Detection

Introduction

Zhiqi Xu is a notable inventor based in Taiyuan, China. He has made significant contributions to the field of subsurface defect detection, particularly for cylindrical components. His innovative approach has led to the development of a specialized device that enhances detection accuracy.

Latest Patents

Zhiqi Xu holds a patent for a "Subsurface defect detecting device for cylindrical components and method thereof." This device includes an electric rotating platform, a three-jaw chuck, and two linear supporting bases. The design allows for optimal laser ultrasound detection angles, accommodating cylindrical components with varying curvature radii. This innovation effectively reduces the impact of uneven surfaces on detection results.

Career Highlights

Throughout his career, Zhiqi Xu has worked with esteemed institutions such as Taiyuan University of Technology and the State Grid Shanxi Electric Power Research Institute. His work in these organizations has furthered research and development in the field of defect detection technology.

Collaborations

Zhiqi Xu has collaborated with notable colleagues, including Yanjie Zhang and Tao Wang. Their combined expertise has contributed to advancements in their respective fields.

Conclusion

Zhiqi Xu's contributions to subsurface defect detection demonstrate his innovative spirit and commitment to enhancing technology in this area. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…