Xi'an, China

Zhiping Jia

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhiping Jia. Retrieved from https://idiyas.com/inventor/zhiping-jia-226tlodg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zhiping Jia and a Patent for Tracking Targets

Introduction

Zhiping Jia is an inventor associated with Xi’an, China, and Huawei Technologies Co., Ltd. His patent work includes an electronic-device method for determining a tracking target.

Latest Patents

The provided information lists one patent for Jia: Method for Determining Tracking Target and Electronic Device. The invention describes an electronic device obtaining multiple image frames and receiving user operations on a target object displayed on a screen. The device displays a target box whose area changes cyclically, uses a further user operation to obtain information about the box in an image frame, and determines a feature vector for the target object from that information. Jia is credited with 1 patent in the supplied data.

Career Highlights

Jia is associated with Huawei Technologies Co., Ltd., a company whose work includes electronic devices and related technologies. The patent described here focuses on identifying a target in image frames through user interaction and feature-vector determination.

Collaborations

The supplied information names Chao Zhang and Jian Xu as Jia’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Zhiping Jia’s listed patent addresses a method for determining a tracking target on an electronic device, combining user input, a changing target box, and image-based feature analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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