Guangzhou, China

Zhijun Zuo

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Guangzhou Mino Equipment Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhijun Zuo. Retrieved from https://idiyas.com/inventor/zhijun-zuo-pyqwxb53

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Zhijun Zuo: Inventor of a Station Takt-Processing Method

Introduction

Zhijun Zuo is an inventor based in Guangzhou, China. His work includes a patented method for analyzing production takt—the time available to complete a unit of work at a station—and identifying fluctuations and bottlenecks.

Latest Patents

Zuo is associated with 1 patent: “Method and Apparatus for Processing Takt at Station, and Storage Medium.” The invention obtains takt data for each station over a preset period and uses it to create a takt boxplot. It also accounts for material blocking, material shortages, and equipment failures to determine effective takt and an effective takt mode. By combining these results with planned takt data, the system generates a station takt wall that helps identify takt fluctuations and production bottlenecks. The patent also describes a system, apparatus, and storage medium for carrying out the method.

Career Highlights

Zuo is associated with Guangzhou Mino Equipment Co., Ltd. His patented work focuses on production-process analysis, using station-level data to help assess operating performance and locate constraints.

Collaborations

The provided information lists Minqi Chen and Xiaojiang Ren as Zuo’s coworkers. It does not specify their roles in the patent or describe the nature of their collaboration.

Conclusion

Zhijun Zuo’s patent addresses production takt analysis by combining operational data with planned targets to reveal station-level fluctuations and bottlenecks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…