Taiyuan, China

Zhihui Xu

This inventor holds 1 USPTO granted patent. Top assignees: State Grid Shanxi Electric Power Research Institute, Taiyuan University of Technology. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhihui Xu. Retrieved from https://idiyas.com/inventor/zhihui-xu-r9ycnflb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Zhihui Xu: Innovator in Subsurface Defect Detection

Introduction

Zhihui Xu is a notable inventor based in Taiyuan, China. He has made significant contributions to the field of subsurface defect detection, particularly for cylindrical components. His innovative approach has led to the development of a specialized device that enhances detection accuracy.

Latest Patents

Zhihui Xu holds a patent for a "Subsurface defect detecting device for cylindrical components and method thereof." This device includes an electric rotating platform, a three-jaw chuck, and two linear supporting bases. The design allows for optimal laser ultrasound detection angles, accommodating cylindrical components with varying curvature radii. This innovation effectively reduces the impact of uneven surfaces on detection results.

Career Highlights

Throughout his career, Zhihui Xu has worked with esteemed institutions such as Taiyuan University of Technology and the State Grid Shanxi Electric Power Research Institute. His work in these organizations has allowed him to refine his expertise in defect detection technologies.

Collaborations

Zhihui Xu has collaborated with notable colleagues, including Yanjie Zhang and Zhiqi Xu. These partnerships have contributed to the advancement of his research and innovations in the field.

Conclusion

Zhihui Xu's contributions to subsurface defect detection demonstrate his commitment to innovation and excellence in engineering. His patented device represents a significant advancement in the detection of defects in cylindrical components, showcasing his expertise and dedication to improving technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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