Houston, TX, United States of America

Zhibo Chen

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Landmark Graphics Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhibo Chen. Retrieved from https://idiyas.com/inventor/zhibo-chen-2pq94ovh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Zhibo Chen: Innovator in Subsurface Horizon Assignment

Introduction

Zhibo Chen is a notable inventor based in Houston, TX (US). He has made significant contributions to the field of seismic data analysis. His innovative work focuses on methods that enhance the understanding of subsurface geological structures.

Latest Patents

Zhibo Chen holds a patent for a "Method and system of subsurface horizon assignment." This patent outlines a process that includes obtaining a seismic data volume, identifying patches within that volume, and displaying these patches for analysis. The method ultimately aids in assigning patches to subsurface horizons, which is crucial for geological assessments.

Career Highlights

Zhibo Chen is associated with Landmark Graphics Corporation, where he applies his expertise in seismic data interpretation. His work has been instrumental in advancing techniques that improve the accuracy of subsurface evaluations.

Collaborations

Zhibo Chen collaborates with esteemed colleagues such as Robert R. Wagner and Xuewei Tan. Their combined efforts contribute to the innovative projects at Landmark Graphics Corporation.

Conclusion

Zhibo Chen's contributions to subsurface horizon assignment demonstrate his commitment to advancing seismic data analysis. His innovative methods continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…