Shenzhen, China

Zhi-Hui Luo

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Hon Hai Precision Industry Co., Ltd.. Active years: 2012-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhi-Hui Luo. Retrieved from https://idiyas.com/inventor/zhi-hui-luo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2012-2014

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3 patents (USPTO):Explore Patents

Title: Zhi-Hui Luo: Innovator in Measurement Technology

Introduction

Zhi-Hui Luo is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of measurement technology, holding a total of 3 patents. His work focuses on enhancing precision and efficiency in measurement devices.

Latest Patents

Among his latest innovations are a coordinate measuring machine and a dimension measuring apparatus with image capabilities. These patents reflect his commitment to advancing measurement technology and improving accuracy in various applications.

Career Highlights

Zhi-Hui Luo is currently employed at Hon Hai Precision Industry Co., Ltd., a leading technology company known for its innovative solutions. His role at the company allows him to apply his expertise in measurement technology to develop cutting-edge products.

Collaborations

Throughout his career, Zhi-Hui has collaborated with notable colleagues, including Chih-Kuang Chang and Wen-Dong Liu. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Zhi-Hui Luo's contributions to measurement technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in precision measurement devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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