Zheong-Gu Khim

Title: The Innovations of Zheong-Gu Khim

Introduction

Zheong-Gu Khim is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of microscopy through his innovative patent. His work focuses on enhancing the measurement of mechanical and electrical characteristics of surfaces.

Latest Patents

Zheong-Gu Khim holds a patent for a "Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode." This advanced microscope utilizes electrostatic force modulation microscopy to accurately measure various characteristics of a sample. The device operates by having a tip contact the sample while a voltage, which may include both direct current (DC) and alternating current (AC) components, is applied between the tip and the sample. The tip oscillates due to the strong electrostatic force interaction, allowing for the measurement of properties such as hardness, surface potential, capacitance, and surface charge by manipulating the oscillation of the tip relative to the sample.

Career Highlights

Zheong-Gu Khim is currently employed at Psia Corporation, where he continues to develop and refine his innovative technologies. His work has positioned him as a key figure in the field of microscopy, contributing to advancements that enhance the understanding of material properties at a microscopic level.

Collaborations

Zheong-Gu Khim collaborates with talented individuals such as Jaewan Hong and Sang-Il Park. Their combined expertise fosters an environment of innovation and progress within their projects.

Conclusion

Zheong-Gu Khim's contributions to the field of microscopy through his patented technology exemplify the impact of innovation in scientific research. His work continues to influence the way mechanical and electrical characteristics of surfaces are measured, paving the way for future advancements.