Columbia, SC, United States of America

Zhenyu Lu

This inventor holds 3 USPTO granted patents. Top assignee: University of South Carolina. Active years: 2016-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhenyu Lu. Retrieved from https://idiyas.com/inventor/zhenyu-lu-88i5x64s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 7.3

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016-2018

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3 patents (USPTO):Explore Patents

Title: Zhenyu Lu: Innovator in Stain Detection Technology

Introduction

Zhenyu Lu is a prominent inventor based in Columbia, SC (US). He has made significant contributions to the field of stain detection technology, holding a total of 3 patents. His work focuses on developing reproducible methods for sample preparation that enhance the accuracy and precision of stain detection.

Latest Patents

Zhenyu Lu's latest patents include a reproducible sample preparation method for quantitative stain detection. This innovation describes a stain-barrier that can be applied to fabric samples. The stain barrier effectively reduces variability between samples of different dilution or fabric types, allowing for more accurate and precise limits of stain detection. This method also facilitates transparent comparisons of stain detection techniques.

Career Highlights

Zhenyu Lu is affiliated with the Medical University of South Carolina, where he continues to advance research in his field. His work has garnered attention for its practical applications in improving stain detection methodologies.

Collaborations

Some of Zhenyu Lu's notable coworkers include Michael L Myrick and Stephen L Morgan. Their collaborative efforts contribute to the ongoing research and development in stain detection technologies.

Conclusion

Zhenyu Lu's innovative work in stain detection technology exemplifies the impact of research and development in practical applications. His contributions are paving the way for more reliable and accurate stain detection methods in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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