Zhengliang Zhou

Title: Innovations by Zhengliang Zhou in Electrical Leakage Testing

Introduction

Zhengliang Zhou is a notable inventor based in Guangdong, China. He has made significant contributions to the field of electrical engineering, particularly in the area of leakage testing structures and methods. His innovative work has led to the development of a patent that addresses critical issues in semiconductor device design.

Latest Patents

Zhengliang Zhou holds a patent for a "Leakage testing structure and leakage testing method." This invention includes an electrical leakage test structure that comprises a substrate, a first well region, and a second well region, both formed in the substrate. It features a first shallow trench isolation structure between the two well regions, a first source/drain region in the first well region, multiple second source/drain regions in the second well region, and a test gate on the substrate. The associated testing method evaluates leakage current across various designed dimensions, helping to identify potential parasitic leakage issues in semiconductor devices.

Career Highlights

Zhengliang Zhou is currently employed at Cansemi Technology Inc., where he continues to innovate and contribute to advancements in electrical testing technologies. His work is pivotal in enhancing the reliability and performance of semiconductor devices.

Collaborations

Zhengliang collaborates with Zeyong Chen, a fellow professional in the field, to further explore and develop innovative solutions in electrical engineering.

Conclusion

Zhengliang Zhou's contributions to electrical leakage testing represent a significant advancement in semiconductor technology. His patent and ongoing work at Cansemi Technology Inc. highlight his commitment to innovation in this critical field.