This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Beijing Aerospace Institute for Metrology and Measurement Technology. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: The Innovative Contributions of Zhengjie Wang
Introduction
Zhengjie Wang is a notable inventor based in Beijing, China. He has made significant contributions to the field of metrology and measurement technology. His work is particularly recognized for its innovative approach to orientation methods.
Latest Patents
Zhengjie Wang holds a patent for a "Single star-based orientation method using dual-axis level sensor." This invention includes a calibration process and an actual calculation process, showcasing his expertise in developing advanced measurement techniques. He has 1 patent to his name.
Career Highlights
Zhengjie Wang is affiliated with the Beijing Aerospace Institute for Metrology and Measurement Technology. His role at this prestigious institution allows him to work on cutting-edge technologies that enhance measurement accuracy and reliability.
Collaborations
Zhengjie collaborates with talented coworkers, including Kun Xiong and Yinxiao Miao. Their combined efforts contribute to the advancement of innovative solutions in their field.
Conclusion
Zhengjie Wang's contributions to the field of metrology and measurement technology highlight his innovative spirit and dedication to advancing scientific knowledge. His work continues to inspire future developments in orientation methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile