Qingdao, China

Zheng Li

This inventor holds 1 USPTO granted patent. Top assignees: Hisense Co., Ltd., Hisense International Co., Ltd., Hisense USA Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zheng Li. Retrieved from https://idiyas.com/inventor/zheng-li-d4d6xtnk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Zheng Li - Innovator in Laser Projection Technology

Introduction

Zheng Li is a prominent inventor based in Qingdao, China. He has made significant contributions to the field of laser projection technology. His innovative approach has led to the development of a unique method and apparatus for controlling laser projection devices.

Latest Patents

Zheng Li holds 1 patent for his invention titled "Method and apparatus for controlling a laser projection device." This patent describes a system that utilizes a thermoinduction sensor to acquire infrared signals in the environment where the laser projection device operates. The method involves acquiring signals at different moments, determining signal change rates, and establishing the operation mode of the device based on these parameters.

Career Highlights

Throughout his career, Zheng Li has worked with notable companies, including Hisense Co., Ltd. and Hisense USA Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Zheng Li has collaborated with talented individuals such as Xu Chen and Jichen Xiao. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Zheng Li's work in laser projection technology exemplifies the spirit of innovation. His patent and career achievements highlight his dedication to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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