Company Filing History:
Years Active: 2018-2020
Title: Innovations of Zhen Cheng in Analog Circuit Fault Diagnosis
Introduction
Zhen Cheng is a notable inventor based in Anhui, China. He has made significant contributions to the field of analog circuit fault diagnosis, holding a total of 3 patents. His work focuses on developing methods that enhance the accuracy and reliability of fault mode classification in analog circuits.
Latest Patents
Zhen Cheng's latest patents include an "Analog Circuit Fault Mode Classification Method" and an "Analog Circuit Fault Diagnosis Method Using Single Testable Node." The fault mode classification method involves several steps, including collecting voltage signal sample vectors, extracting fault characteristic vectors, and constructing a fault mode classifier based on a support vector machine. This method is designed to be simple in learning and training while ensuring reliable mode classification accuracy.
The fault diagnosis method utilizes a single testable node and includes steps such as obtaining prior sample data vectors, computing statistical averages, and determining fault modes based on correlation principles. This innovative approach allows for the conversion of a single signal into multiple signals without losing original measurement information, thereby enhancing the classification of circuit fault modes.
Career Highlights
Zhen Cheng is affiliated with Hefei University of Technology, where he continues to advance his research in analog circuits. His work has garnered attention for its practical applications in improving fault diagnosis methods, which are crucial for maintaining the integrity of electronic systems.
Collaborations
Zhen Cheng collaborates with esteemed colleagues, including Lifen Yuan and Yigang He. Their combined expertise contributes to the advancement of research in the field of analog circuit diagnostics.
Conclusion
Zhen Cheng's innovative contributions to analog circuit fault diagnosis demonstrate his commitment to enhancing the reliability and accuracy of electronic systems. His patents reflect a deep understanding of the complexities involved in fault mode classification and diagnosis.