Hangzhou, China

Zhen Bi

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhen Bi. Retrieved from https://idiyas.com/inventor/zhen-bi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Zhen Bi - Innovator in Generative Event Extraction

Introduction

Zhen Bi is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of event extraction through his innovative methodologies. His work focuses on enhancing the efficiency and accuracy of event extraction processes.

Latest Patents

Zhen Bi holds a patent for a "Generative event extraction method based on ontology guidance." This invention outlines a comprehensive approach that includes constructing an event ontology knowledge base, designing extraction templates, and utilizing a class label mapping function. The method aims to predict event types and roles effectively, thereby improving the overall event extraction model.

Career Highlights

Zhen Bi is affiliated with Zhejiang University, where he continues to advance research in his field. His dedication to innovation has led to the development of cutting-edge technologies that benefit various applications in data processing and analysis.

Collaborations

Zhen Bi has worked alongside notable colleagues, including Ningyu Zhang and Huajun Chen. Their collaborative efforts contribute to the ongoing research and development in event extraction methodologies.

Conclusion

Zhen Bi's contributions to generative event extraction highlight his role as an influential inventor in the field. His innovative methods pave the way for advancements in data processing and analysis, showcasing the importance of his work.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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