This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Zhechao Qu: Innovator in Optical Laser Measurement Technology
Introduction
Zhechao Qu is a prominent inventor based in Chengdu, China. He has made significant contributions to the field of optical laser components through his innovative patent. His work focuses on enhancing the measurement techniques for reflectance in optical laser components, which is crucial for various applications in technology and research.
Latest Patents
Zhechao Qu holds a patent titled "Apparatus and method for measuring reflectance of optical laser components." This invention discloses a method for measuring the reflectance of optical laser components using a cavity ring-down (CRD) technique. When the reflectance of the test optical laser component exceeds 98%, the CRD technique is employed. Conversely, if the reflectance is below 98% or if there is no measurable CRD signal, a photometric configuration is utilized by removing the output cavity mirror in the CRD apparatus. This innovative switching mechanism between the two techniques enhances the accuracy and efficiency of reflectance measurements.
Career Highlights
Zhechao Qu is affiliated with the Chinese Academy of Sciences, where he conducts research and development in optical technologies. His work has garnered attention for its practical applications and contributions to the scientific community. With a focus on precision measurement techniques, Qu continues to push the boundaries of innovation in his field.
Collaborations
Zhechao Qu collaborates with esteemed colleagues such as Bincheng Li and Yanling Han. Their combined expertise fosters a productive research environment, leading to advancements in optical measurement technologies.
Conclusion
Zhechao Qu's contributions to the field of optical laser measurement are noteworthy. His innovative patent reflects his commitment to enhancing measurement techniques, which can have a lasting impact on technology and research. His work exemplifies the spirit of innovation that drives progress in scientific fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile