Shanxi, China

Zhe Liu

This inventor holds 1 USPTO granted patent. Top assignee: The Chinese University of Hong Kong. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhe Liu. Retrieved from https://idiyas.com/inventor/zhe-liu-kpi4gxa8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Zhe Liu: Innovator in 3D Point Cloud Recognition

Introduction

Zhe Liu is a prominent inventor based in Shanxi, China. He has made significant contributions to the field of place recognition through his innovative patent. His work focuses on utilizing 3D point clouds to enhance the accuracy and efficiency of recognizing various locations.

Latest Patents

Zhe Liu holds a patent titled "Systems and methods for place recognition based on 3D point cloud." This patent outlines a computer-implemented method that involves capturing a 3D point cloud of an area, extracting local features from each point, and generating a global descriptor using a deep neural network. The method constructs a place descriptor map and recognizes the area based on this map. He has 1 patent to his name.

Career Highlights

Zhe Liu is affiliated with The Chinese University of Hong Kong, where he contributes to research and development in the field of computer science and engineering. His work has implications for various applications, including robotics and autonomous navigation.

Collaborations

Some of his notable coworkers include Chuanzhe Suo and Wen Chen, who collaborate with him on various research projects.

Conclusion

Zhe Liu's innovative approach to place recognition using 3D point clouds showcases his expertise and commitment to advancing technology in this field. His contributions are paving the way for future developments in spatial recognition systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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