Zhanjun Duan

Title: Zhanjun Duan: Innovator in CT Security Inspection Systems

Introduction

Zhanjun Duan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of security inspection technology, particularly in the development of advanced CT systems. With a total of 3 patents to his name, Duan's work has been instrumental in enhancing the safety and efficiency of baggage inspection processes.

Latest Patents

Duan's latest patents include a CT security inspection system for baggage and a CT apparatus without a gantry. The CT security inspection system comprises a scanning passage for baggage, an X-ray source, and a gantry with multiple detector units. This innovative design ensures that all detector crystal receiving faces are within the scope of radiating ray beams, enhancing the accuracy of the inspection process. The CT apparatus without a gantry features a stationary X-ray source and stationary detector modules arranged around the scanning passage, allowing for a compact design while maintaining high data identification accuracy.

Career Highlights

Throughout his career, Zhanjun Duan has worked with notable companies such as Nuctech Company Limited and Nutech Company Limited. His experience in these organizations has allowed him to develop and refine his inventions, contributing to advancements in security technology.

Collaborations

Duan has collaborated with several professionals in his field, including Li Ni Zhang and Jinyu Zhang. These partnerships have fostered innovation and have been crucial in the development of his patented technologies.

Conclusion

Zhanjun Duan's contributions to CT security inspection systems highlight his role as a leading inventor in the field. His innovative patents and career achievements reflect his commitment to enhancing security technology.