Binhai New Area, China

Zhang Zhang

This inventor holds 1 USPTO granted patent. Top assignee: China Oilfield Services, Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhang Zhang. Retrieved from https://idiyas.com/inventor/zhang-zhang-vegujgnu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zhang Zhang: Inventor in Image Definition Recognition

Introduction

Zhang Zhang is an inventor based in Binhai New Area, China. His patent work includes a method for assessing the definition of logging images, with an emphasis on combining algorithm outputs and their corresponding weights.

Latest Patents

Zhang Zhang is associated with 1 patent: “Logging Image Definition Recognition Method and Device, Medium, and Electronic Equipment.” The disclosure describes establishing a sample library of logging images and obtaining actual definition information for each image. It then uses multiple image-definition algorithms to produce assessments, determines weights for those algorithms by comparing their results with the actual information, and applies the weighted algorithms to determine the definition of a target logging image.

Career Highlights

Zhang Zhang is associated with China Oilfield Services, Limited. His disclosed patent focuses on image-definition recognition for logging images and describes a process for combining multiple algorithmic assessments.

Collaborations

The available information associates Zhang Zhang with China Oilfield Services, Limited, but does not specify collaborators or other organizations involved in the patent.

Conclusion

Zhang Zhang’s patent describes a weighted, multi-algorithm approach to determining logging-image definition, connecting his disclosed invention with his association with China Oilfield Services, Limited.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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