Ningde, China

Zeyu Zheng

This inventor holds 1 USPTO granted patent. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zeyu Zheng. Retrieved from https://idiyas.com/inventor/zeyu-zheng-n2s7bfgh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zeyu Zheng and a Patent for Battery-Case Debris Management.

Introduction

Zeyu Zheng is an inventor associated with Ningde, China, and Contemporary Amperex Technology (Hong Kong) Limited. His patent work addresses debris management in battery-case packaging, with the aim of supporting cleaner assembly and safer workpieces.

Latest Patents

Zheng is identified with 1 patent: “Debris Collection Component, Debris Collection Assembly, and Battery Case Packaging Structure and Method.” The invention describes a collection tray positioned between adjacent workpieces stacked in the direction of gravity, along with a retaining member that helps keep collected debris in place. By capturing debris falling from an upper workpiece, the design aims to reduce contamination on other workpieces and limit potential effects on later assembly and safety during use.

Career Highlights

Zheng’s listed patent connects his work with battery-case packaging and manufacturing processes. The disclosed collection component and assembly offer a practical approach to controlling debris around stacked workpieces.

Collaborations

Zheng’s listed coworkers include Pengbo Zhao and Yong Wang. His company affiliation is Contemporary Amperex Technology (Hong Kong) Limited.

Conclusion

Zeyu Zheng’s patent focuses on collecting and retaining debris during battery-case packaging, helping address contamination, assembly, and workpiece safety concerns.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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