Zeyu Sun

Title: Zeyu Sun - Innovator in Defect Location Technology

Introduction

Zeyu Sun is a prominent inventor based in Beijing, China. He has made significant contributions to the field of software engineering, particularly in defect location methodologies. His innovative approach combines advanced graph neural network models with program structure analysis to enhance the accuracy of defect detection.

Latest Patents

Zeyu Sun holds a patent for a "Defect location method and device based on coverage information." This patent outlines a method that characterizes program structure and test case coverage information in a graph format. The process involves generating a node attribute sequence and an adjacency matrix, which are then input into a trained graph neural network model. The model outputs a suspicious degree list for the target program, improving defect location accuracy by preserving coverage information without loss or compression.

Career Highlights

Zeyu Sun is affiliated with Peking University, where he continues to advance his research and development in software defect location technologies. His work has garnered attention for its innovative use of graph-based information characterization.

Collaborations

Zeyu collaborates with notable colleagues, including Lu Zhang and Yiling Lou, who contribute to his research endeavors and enhance the collaborative environment at Peking University.

Conclusion

Zeyu Sun's contributions to defect location technology exemplify the intersection of innovation and practical application in software engineering. His work not only advances academic research but also has the potential to significantly impact the software development industry.