Renton, WA, United States of America

Zenaida Castro Canlas-Factora

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Zenaida Castro Canlas-Factora: Innovator in Routing Optimization

Introduction

Zenaida Castro Canlas-Factora is a notable inventor based in Renton, WA (US). She has made significant contributions to the field of telecommunications, particularly in routing optimization for service capability exposure. Her innovative work has implications for enhancing network efficiency and service delivery.

Latest Patents

Zenaida holds a patent titled "Routing optimization for service capability exposure." This patent describes a method where a carrier network can provide connection establishment and routing optimization for the Service Capability Exposure Function (SCEF). The process involves a Mobility Management Entity (MME) transmitting a connection request to establish a session, utilizing a first SCEF identifier (ID). The MME subsequently receives an answer from a specific SCEF instance, which includes a different identifier associated with that instance. This allows for optimized communication and session management.

Career Highlights

Zenaida is currently employed at T-Mobile USA, Inc., where she continues to develop innovative solutions in telecommunications. Her work focuses on improving network capabilities and enhancing user experiences through advanced routing techniques.

Collaborations

Throughout her career, Zenaida has collaborated with talented professionals, including Kameswaran Arunachalam and Kunal Prakash Barawkar. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Zenaida Castro Canlas-Factora is a pioneering inventor whose work in routing optimization is shaping the future of telecommunications. Her contributions are vital for advancing network efficiency and service capability exposure.

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