This inventor holds 1 USPTO granted patent. Top assignee: Sigma Corporation. Active years: 1987.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1987
Title: Zbigniew Zaremba: Innovator in Component Measurement Technology
Introduction
Zbigniew Zaremba is a notable inventor based in Bedford, GB. He has made significant contributions to the field of component measurement technology. His innovative approach has led to the development of a unique patent that enhances the accuracy of component inspection.
Latest Patents
Zaremba holds a patent for a "Component measuring apparatus with multiple component multiple." This apparatus features a component holder mounted on a compound slide structure. It includes two arrays of gauging elements on a mutually perpendicularly movable slide. The arrays can be adjusted on the slide and consist of multiple separate gauge elements that are movable by contact with the work. Additionally, at least one linear transducer is connected to each gauge element. In practice, the slides are moved to a series of predetermined positions in a sequence. The displacements of the probe elements at each position are recorded and compared with displacements obtained when a master component is in the holder.
Career Highlights
Zaremba's career is marked by his dedication to advancing measurement technology. His work at Sigma Corporation has allowed him to apply his innovative ideas in a practical setting. His patent reflects his commitment to improving the efficiency and accuracy of component inspection processes.
Collaborations
Zaremba has collaborated with talented individuals such as Eric Ireland and Rory M O'Brien. These partnerships have contributed to the development of his innovative technologies and have fostered a collaborative environment for creativity and problem-solving.
Conclusion
Zbigniew Zaremba is a distinguished inventor whose work in component measurement technology has made a significant impact. His patent showcases his innovative spirit and dedication to enhancing inspection processes. His contributions continue to influence the field and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile