Beijing, China

Zang Kyu Lim

This inventor holds 1 USPTO granted patent. Top assignee: Beijing Boe Optoelectronics Technology Co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zang Kyu Lim. Retrieved from https://idiyas.com/inventor/zang-kyu-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Zang Kyu Lim: Innovator in Thin Film Patterning Technology

Introduction

Zang Kyu Lim is a prominent inventor based in Beijing, China. He has made significant contributions to the field of liquid crystal display technology. His innovative work has led to the development of a unique thin film patterning method.

Latest Patents

Zang Kyu Lim holds a patent for a "Thin film patterning method and method for manufacturing a liquid crystal display device." This patent describes a process that includes depositing a first thin film, applying a photoresist layer, and defining various regions through exposure and development. The method also involves over-etching to create specific regions and lifting off the photoresist layer to expose the substrate.

Career Highlights

Zang Kyu Lim is associated with Beijing BOE Optoelectronics Technology Co., Ltd. His work at this company has been instrumental in advancing display technologies. He has a total of 1 patent to his name, showcasing his innovative capabilities in the industry.

Collaborations

Zang Kyu Lim has collaborated with notable colleagues such as Tae Yup Min and Sung Hun Song. Their teamwork has contributed to the success of various projects within the company.

Conclusion

Zang Kyu Lim's contributions to thin film patterning technology highlight his role as an innovator in the field. His patent and collaborations reflect his commitment to advancing liquid crystal display technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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