Fort Collins, CO, United States of America

Zack Sutton

This inventor holds 1 USPTO granted patent. Top assignee: Biomechanics Consulting and Research, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zack Sutton. Retrieved from https://idiyas.com/inventor/zack-sutton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Zack Sutton in Turf Testing Technology

Introduction

Zack Sutton is an innovative inventor based in Fort Collins, Colorado. He has made significant contributions to the field of turf testing technology. His work focuses on improving the inspection and analysis of various surfaces, including grass and artificial turf.

Latest Patents

Zack Sutton holds a patent for an "Automated Turf Testing Apparatus and System for Using Same." This invention provides an apparatus and method for inspecting surfaces using optical photographic images and three-dimensional depth scans. The technology utilizes a camera and lasers to create a mask that distinguishes different aspects of the surface, allowing for precise measurement and analysis.

Career Highlights

Zack is currently employed at Biomechanics Consulting and Research, LLC, where he applies his expertise in biomechanics and turf testing. His innovative approach has positioned him as a key player in the development of advanced testing systems.

Collaborations

Zack collaborates with notable professionals in his field, including Jeff Crandall and Edward Meade Spratley. Their combined expertise enhances the research and development efforts at their company.

Conclusion

Zack Sutton's contributions to turf testing technology demonstrate his commitment to innovation and excellence. His patent and work at Biomechanics Consulting and Research, LLC highlight the importance of advanced testing methods in ensuring the quality of various surfaces.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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