St. Louis, MO, United States of America

Yvonne Landt

This inventor holds 3 USPTO granted patents, plus 2 CIPO patents and 2 EPO patents. Top assignee: Washington University. Active years: 2009-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yvonne Landt. Retrieved from https://idiyas.com/inventor/yvonne-landt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7


 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2009-2018

Loading Chart...
Loading Chart...
Loading Chart...
3 patents (USPTO):Explore Patents

Title: Innovations by Yvonne Landt in Brain Damage Detection

Introduction

Yvonne Landt is an accomplished inventor based in St. Louis, MO (US). She has made significant contributions to the field of neuroscience, particularly in the detection of brain damage. With a total of 3 patents to her name, her work is paving the way for advancements in medical diagnostics.

Latest Patents

One of her notable patents focuses on markers for brain damage. This patent discloses methods to identify these markers using fresh brain tissue. Additionally, it includes methods and compositions for detecting these markers, which could greatly enhance the understanding and treatment of brain injuries.

Career Highlights

Yvonne Landt is affiliated with Washington University, where she continues her research and innovation. Her work is instrumental in developing new techniques that could lead to better diagnostic tools for brain-related conditions.

Collaborations

Throughout her career, Yvonne has collaborated with esteemed colleagues such as Jack H. Ladenson and Vijay Modur. These partnerships have further enriched her research and contributed to the success of her inventions.

Conclusion

Yvonne Landt's innovative work in identifying markers for brain damage represents a significant advancement in medical science. Her contributions are vital for improving diagnostic methods and ultimately enhancing patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…