Yerres, France

Yves Mathieu

This inventor holds 1 USPTO granted patent. Top assignee: St-Ericsson Sa. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yves Mathieu. Retrieved from https://idiyas.com/inventor/yves-mathieu-30obctqg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yves Mathieu

Introduction

Yves Mathieu is a notable inventor based in Yerres, France. He has made significant contributions to the field of 3D display technology. His innovative approach has led to the development of a unique method for generating image views.

Latest Patents

Yves Mathieu holds a patent for a "Method and device for generating an image view for 3D display." This patent describes a method for generating an image view from at least one input image for a 3D display. The technique utilizes backward processing, enabling post-processing to handle holes in the image view. This innovation enhances the quality and effectiveness of 3D displays.

Career Highlights

Yves Mathieu is associated with ST-Ericsson SA, where he has contributed his expertise in image processing and display technologies. His work has been instrumental in advancing the capabilities of 3D imaging systems.

Collaborations

Yves has collaborated with talented individuals such as Laurent Pasquier and Jean Gobert. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Yves Mathieu's contributions to 3D display technology exemplify the impact of innovative thinking in the field of imaging. His patent and collaborative efforts highlight the importance of creativity and teamwork in driving technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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