Toronto, Canada

Yves J C Leblanc


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2011-2013

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2 patents (USPTO):Explore Patents

Title: Yves J C Leblanc: Innovator in Mass Spectrometry

Introduction

Yves J C Leblanc is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of mass spectrometry, particularly in the area of ion separation and detection. With a total of 2 patents to his name, Leblanc's work has advanced the capabilities of ion traps in scientific research.

Latest Patents

Leblanc's latest patents focus on high-resolution excitation and isolation of ions in a low-pressure linear ion trap. These methods improve the separation of ions from an ion trap by employing a combination of low pressure and low amplitude ion excitation. His innovations include techniques for removing ions with a mass-to-charge (m/z) value neighboring that of an ion of interest. Additionally, his mass spectrometry methods provide enhanced resolution of ion detection, supported by programmable apparatus programmed with specific instructions.

Career Highlights

Yves J C Leblanc is currently associated with Dh Technologies Development Pte. Ltd., where he continues to push the boundaries of ion trap technology. His expertise in mass spectrometry has positioned him as a key figure in the development of advanced analytical techniques.

Collaborations

Leblanc collaborates with fellow innovator Bruce Andrew Collings, contributing to the advancement of their shared research interests.

Conclusion

Yves J C Leblanc's contributions to mass spectrometry and ion trap technology highlight his role as a leading inventor in the field. His innovative patents and ongoing work continue to influence scientific research and applications.

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