This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1992.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1992
Title: Yuzou Ohhirabaru: Innovator in Etching Detection Technology
Introduction
Yuzou Ohhirabaru is a notable inventor based in Kudamatsu, Japan. He has made significant contributions to the field of etching technology, particularly in the detection of end points during the etching process. His innovative approach has implications for various industries that rely on precise etching techniques.
Latest Patents
Yuzou Ohhirabaru holds a patent for an "Apparatus for detecting an end point of etching." This invention presents a method of detecting the end point of etching by utilizing emission spectroscopy. The technique involves calculating a correction value based on a constant ratio between emission intensities during and after the etching process. By processing the waveform of the corresponding emission intensity, the detection can be conducted with the same accuracy as in the initial treatment, regardless of the reduction in emission quantity.
Career Highlights
Ohhirabaru is associated with Hitachi, Ltd., where he has been able to apply his expertise in etching technology. His work has contributed to advancements in manufacturing processes that require high precision and reliability. With a focus on innovation, he continues to push the boundaries of what is possible in the field.
Collaborations
Yuzou Ohhirabaru has collaborated with notable colleagues such as Tetsunori Kaji and Gen Marumoto. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Yuzou Ohhirabaru's contributions to etching detection technology exemplify the impact of innovative thinking in engineering. His patent and work at Hitachi, Ltd. highlight the importance of precision in manufacturing processes. Through his efforts, he continues to influence the field and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
