Aichi, Japan

Yuya Kawabata

This inventor holds 1 USPTO granted patent. Top assignees: Nagoya University, Tohoku University, Tokuyama Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuya Kawabata. Retrieved from https://idiyas.com/inventor/yuya-kawabata-q69fvb7t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Yuya Kawabata: Innovator in Neutron Detection Technology

Introduction

Yuya Kawabata is a notable inventor based in Aichi, Japan. He has made significant contributions to the field of neutron detection technology. His innovative work has led to the development of a scintillation neutron detector that enhances measurement precision.

Latest Patents

Kawabata holds a patent for a scintillation neutron detector. This device is capable of measuring neutrons with precision, even in environments with high levels of gamma rays as background noise. The detector features a neutron scintillator crystal containing lithium, which has a specific surface area of no less than 60 cm/cm. This design ensures excellent neutron counting precision.

Career Highlights

Throughout his career, Yuya Kawabata has worked with prominent organizations such as Tokuyama Corporation and Nagoya University. His experience in these institutions has allowed him to refine his skills and contribute to advancements in neutron detection technology.

Collaborations

Kawabata has collaborated with notable colleagues, including Kenichi Watanabe and Atsushi Yamazaki. Their combined expertise has furthered the development of innovative technologies in their respective fields.

Conclusion

Yuya Kawabata's contributions to neutron detection technology exemplify his dedication to innovation. His work continues to influence advancements in scientific measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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