Yokohama, Japan

Yuuya Okano

This inventor holds 1 USPTO granted patent. Top assignees: Kabushiki Kaisha Toshiba, Toshiba Energy Systems & Solutions Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuuya Okano. Retrieved from https://idiyas.com/inventor/yuuya-okano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yuuya Okano and Partial-Discharge Diagnostics

Introduction

Yuuya Okano is an inventor associated with Yokohama, Japan. His patent work includes technology for diagnosing partial discharge in electrical insulators, using data processing and machine learning to help identify discharge factors or determine whether partial discharge is present.

Latest Patents

Okano is credited with 1 patent: “Partial-discharge diagnostic device, partial-discharge diagnostic method, and partial-discharge diagnostic system.” The invention describes a diagnostic device with a processor that generates data in a predetermined format while reducing a pseudo partial-discharge signal in an electrical signal that varies with phase. A learning-model generator then uses the data to create a model that determines at least one of the partial-discharge factor or whether partial discharge is present.

Career Highlights

Okano’s listed company affiliations include Kabushiki Kaisha Toshiba and Toshiba Energy Systems & Solutions Corporation. His patent reflects work at the intersection of electrical diagnostics, signal processing, and machine learning.

Collaborations

His named coworkers include Shoichi Kashiwase and Takashi Harakawa.

Conclusion

Yuuya Okano’s patent describes a machine-learning-based approach to partial-discharge diagnosis, contributing to the development of tools for assessing electrical insulation systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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