Hitachinaka, Japan

Yuusuke Narita


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Yuusuke Narita: Innovator in Charged Particle Beam Technology

Introduction

Yuusuke Narita is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology. His innovative work has led to the development of a unique apparatus that enhances the precision of charged particle beams.

Latest Patents

Yuusuke Narita holds 1 patent for his invention titled "Charged particle beam apparatus and method for charged particle beam adjustment." This patent addresses the challenges of adjusting the beam center axis of a charged particle beam when optical conditions change or when the beam center axis shifts due to variations in the apparatus's state. The invention includes a two-step process: the first step measures the sensitivity of the aligner, and the second step detects the deviation between the primary charged particle beam's center and the objective aperture's center. The apparatus then determines the aligner set values to ensure the primary charged particle beam passes through the center of the objective aperture.

Career Highlights

Yuusuke Narita is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing charged particle beam technologies. His work has not only contributed to the company's reputation but has also pushed the boundaries of what is possible in this field.

Collaborations

Yuusuke has collaborated with notable colleagues, including Takeshi Ogashiwa and Mitsugu Sato. Their combined expertise has fostered an environment of innovation and creativity within their projects.

Conclusion

Yuusuke Narita's contributions to charged particle beam technology exemplify the spirit of innovation. His patented apparatus represents a significant advancement in the field, showcasing his dedication to enhancing precision in scientific applications.

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