Kokubunji, Japan

Yuuri Yano

This inventor holds 2 USPTO granted patents. Top assignee: Konica Minolta, Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuuri Yano. Retrieved from https://idiyas.com/inventor/yuuri-yano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Yuuri Yano: Inventor of Radiation Imaging Technologies.

Introduction

Yuuri Yano is an inventor associated with Kokubunji, Japan, and Konica Minolta, Inc. Yano’s work includes inventions for radiation imaging and detection. The available information lists 2 patents.

Latest Patents

Yano’s listed patents address the construction and support of radiation imaging equipment.

- **Radiation image photographing apparatus.** This invention describes a charged-material base with a radiation sensor on one surface, housed together in an enclosure. An antistatic member is positioned between the housing and the base’s opposite surface.

- **Radiation detecting device.** This invention describes a flexible board with a semiconductor element on its imaging surface, supported within a housing. A cushion is placed between the supporter and either the radiation detector or the rear part of the housing.

Career Highlights

Yano’s listed inventions focus on components that support radiation detection, including antistatic protection and cushioning within imaging-device assemblies. The supplied information identifies Konica Minolta, Inc. as Yano’s company.

Collaborations

The listed coworkers are Hiroshi Utsunomiya and Junichiro Otaki. The available information does not specify the nature of their collaborations with Yano.

Conclusion

Yuuri Yano’s listed patent work at Konica Minolta, Inc. centers on radiation imaging and detector design, with attention to device protection and structural support.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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