This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 1993.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1993
Title: Yuuji Itoh: Innovator in Sample Measuring Methods
Introduction
Yuuji Itoh is a notable inventor based in Chigasaki, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent related to sample measuring methods. His work has implications for various applications in scientific research and industry.
Latest Patents
Yuuji Itoh holds a patent for a "Sample measuring method using agglomeration reaction of microcarriers." This method involves preparing a mixture by combining carriers that adhere to a substance specifically reacting with an object substance. The mixture is then irradiated with light of varying intensity, which concentrates the carriers at and near the irradiated positions due to the optical pressure of the light. This process enhances the efficiency of the agglomeration reaction of the carriers, allowing for qualitative or quantitative measurements of the object substance by detecting the state of agglomeration within the mixture. He has 1 patent to his name.
Career Highlights
Yuuji Itoh is associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His role at Canon has allowed him to leverage his expertise in measurement technology, contributing to the company's innovative projects and advancements in the field.
Collaborations
Yuuji Itoh has worked alongside talented colleagues, including Michiyo Itoh and Yoshiyuki Touge. Their collaborative efforts have fostered a creative environment that encourages innovation and the development of new technologies.
Conclusion
Yuuji Itoh's contributions to sample measuring methods exemplify the impact of innovative thinking in technology. His patent and work at Canon highlight the importance of collaboration and creativity in advancing scientific measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
