This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hoya Corporation. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: **Innovations of Yuudai Ishikawa: A Pioneer in Defect Inspection Apparatus**
Introduction
Yuudai Ishikawa, an accomplished inventor based in Kumamoto, Japan, has made significant contributions to the field of defect inspection technology. With a focus on enhancing the reliability of product quality, his innovative approaches have garnered attention in various industries.
Latest Patents
Ishikawa holds a patent for a "Defect Inspection Apparatus and Defect Inspection Method." This invention addresses the inspection of objects with repeated patterns on their surfaces, aiming to detect irregularity defects within those patterns. The apparatus utilizes a specialized light source that applies light at a precise incidence angle to illumination regions of the object, combined with an innovative observation system that captures the light reflected from the inspection surface. The design specifications include a light source demonstrating a parallelism of 2 degrees or less, achieving an illuminance level of over 300,000 Lux, which contributes to high-precision inspection capabilities.
Career Highlights
Yuudai Ishikawa is currently associated with Hoya Corporation, a renowned name in the optics and electronics sector, recognized for its pioneering technologies. Throughout his career, he has focused on developing inspection technologies that enhance quality assurance in manufacturing processes. His dedication to innovation continues to position him as a key player in the industry.
Collaborations
In his journey as an inventor, Ishikawa has collaborated with Noboru Yamaguchi, a coworker at Hoya Corporation. Their partnership has fostered a creative environment, allowing for the exchange of ideas and expertise in the realm of defect inspection technologies.
Conclusion
Yuudai Ishikawa stands out as a prominent inventor whose work in defect inspection technology has the potential to greatly enhance manufacturing quality assurance. With his innovative apparatus, he addresses critical challenges in inspecting complex patterns, ultimately contributing to improved product standards in various industries. His ongoing commitment to innovation continues to inspire others in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile