Osaka, Japan

Yutaro Sonoyama

This inventor holds 1 USPTO granted patent. Top assignee: Panasonic Intellectual Property Management Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yutaro Sonoyama. Retrieved from https://idiyas.com/inventor/yutaro-sonoyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yutaro Sonoyama: Innovator in Imaging Optical Systems

Introduction

Yutaro Sonoyama is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of imaging optical systems. His work is recognized for its innovative approach and technical precision.

Latest Patents

Yutaro Sonoyama holds a patent for an imaging optical system and camera. This system includes a first lens with negative power and a concave image-side surface, a second lens with power, a third lens with positive power, a fourth lens with power, and a fifth lens with power. The imaging optical system satisfies specific conditions expressed by inequalities related to the paraxial radius of curvature and total optical length.

Career Highlights

Yutaro Sonoyama is associated with Panasonic Intellectual Property Management Co., Ltd. His role in the company has allowed him to focus on developing advanced optical technologies. His patent reflects his expertise and commitment to innovation in imaging systems.

Collaborations

Yutaro has collaborated with Naoto Nishimura, contributing to the development of cutting-edge optical solutions. Their teamwork has enhanced the quality and functionality of imaging technologies.

Conclusion

Yutaro Sonoyama's contributions to imaging optical systems exemplify his innovative spirit and technical skill. His patent showcases the potential for advancements in camera technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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